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Error modeling of a new kind of plane movement position and attitude measuring equipment
Xu ZG(徐志刚); Xin LM(辛立明); Zhao MY(赵明扬)
Department现代装备研究室
Conference NameIEEE International Conference on Automation and Logistics
Conference DateAugust 18-21, 2007
Conference PlaceJinan, China
Author of SourceIEEE, IEEE Robot & Automat Soc, Shandong Univ, Chinese Univ Hong Kong, Chinese Mech Engn Soc, Logist Engn Inst China, China Federat Logist & Purchasing, IEEE Hong Kong, Sect RACS Chapter
Source Publication2007 IEEE INTERNATIONAL CONFERENCE ON AUTOMATION AND LOGISTICS, VOLS 1-6
PublisherIEEE, ELECTRON DEVICES SOC & RELIABILITY GROUP
Publication PlaceNEW YORK
2007
Pages2700-2705
Indexed ByEI ; CPCI(ISTP)
EI Accession number20081211155361
WOS IDWOS:000252380300520
Contribution Rank1
ISBN978-1-4244-1530-4
KeywordPosition And Attitude Measurement Error Modeling Differential Law Principles
AbstractThis paper presents a new kind of measurement mechanism for the position and attitude measurement of the moving object in a plane. The mechanism and the measurement principles are described and the error models are built by using differential law principles. Analysis practical applying and the simulation demonstrate the feasibility of the method. This mechanism with. characters of high precision and simple is applicable to high-precision and large-space plane movement measurement under some special measurement conditions.
Language英语
Citation statistics
Cited Times:1[WOS]   [WOS Record]     [Related Records in WOS]
Document Type会议论文
Identifierhttp://ir.sia.cn/handle/173321/7880
Collection智能产线与系统研究室
AffiliationShenyang Institute of Automation, Chinese Academy of Science, Graduate School of the Chinese Academy of Sciences Shenyang, Liaoning Province, China
Recommended Citation
GB/T 7714
Xu ZG,Xin LM,Zhao MY. Error modeling of a new kind of plane movement position and attitude measuring equipment[C]//IEEE, IEEE Robot & Automat Soc, Shandong Univ, Chinese Univ Hong Kong, Chinese Mech Engn Soc, Logist Engn Inst China, China Federat Logist & Purchasing, IEEE Hong Kong, Sect RACS Chapter. NEW YORK:IEEE, ELECTRON DEVICES SOC & RELIABILITY GROUP,2007:2700-2705.
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