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A rapid and automated relocation method of an AFM probe for high-resolution imaging 期刊论文
Nanotechnology, 2016, 卷号: 27, 期号: 39, 页码: 1-10
Authors:  Zhou PL(周培林);  Yu HB(于海波);  Shi JL(施佳林);  Jiao ND(焦念东);  Wang ZD(王志东);  Wang YC(王越超);  Liu LQ(刘连庆)
Adobe PDF(3511Kb)  |  Favorite  |  View/Download:334/84  |  Submit date:2016/10/04
Afm  Relocation  Automated  Label-free  Nano Targets